Magneto-Optical Characterization of the Nitrogen-Related Impurities in p-Type ZnSe Epilayers

2000 ◽  
Vol 180 (1) ◽  
pp. 195-199 ◽  
Author(s):  
L. Gravier ◽  
H. Makino ◽  
K. Arai ◽  
H. Sasaki ◽  
K. Kimura ◽  
...  
Keyword(s):  
Optical Characterization ◽  
Related Impurities ◽  
P Type

Optical characterization of Ba0.5Sr0.5TiO3 material grown on a p-type silicon substrate (111) doped niobium oxide and chlorophyll

2020 ◽  
Vol 568 (1) ◽  
pp. 62-70
Author(s):  
Aep Setiawan ◽  
Endah Kinarya Palupi ◽  
Rofiqul Umam ◽  
Husin Alatas ◽  
Irzaman
Keyword(s):  
Silicon Substrate ◽  
Niobium Oxide ◽  
Optical Characterization ◽  
Type Silicon ◽  
P Type

Electrical and Optical Characterization of p-Type Boron-Doped 6H-SiC Bulk Crystals

2003 ◽  
Vol 433-436 ◽  
pp. 337-340 ◽  
Author(s):  
Matthias Bickermann ◽  
Roland Weingärtner ◽  
Z.G. Herro ◽  
Dieter Hofmann ◽  
Ulrike Künecke ◽  
...  
Keyword(s):  
Optical Characterization ◽  
Bulk Crystals ◽  
Boron Doped ◽  
P Type

Optical characterization of magnetron sputtered p-type ZnO thin films codoped with Ga and As

2011 ◽  
Vol 209 (2) ◽  
pp. 294-296 ◽  
Author(s):  
Jang-Ho Park ◽  
Ho-Yeon Seo ◽  
Sang-Hun Jeong ◽  
Byung-Teak Lee
Keyword(s):  
Thin Films ◽  
Optical Characterization ◽  
Zno Thin Films ◽  
P Type

Optical Characterization of Compensating Defects in Cubic SiC

2013 ◽  
Vol 740-742 ◽  
pp. 401-404
Author(s):  
Patrik Ščajev ◽  
K. Jarašiūnas ◽  
P.L. Abramov ◽  
S.P. Lebedev ◽  
A.A. Lebedev
Keyword(s):  
Carrier Density ◽  
Nonlinear Optical ◽  
Carrier Lifetime ◽  
Optical Trap ◽  
Optical Characterization ◽  
Carrier Dynamics ◽  
Time Resolved ◽  
Carrier Recombination ◽  
P Type

We present investigation of carrier recombination and optical trap recharge in sublimation grown n- and p-type 3C layers by using time-resolved nonlinear optical techniques. Carrier lifetime and recharged trap recovery were measured by differential transmittivity technique. By monitoring nonequilibrium carrier dynamics, we analyzed impact of carrier density and temperature on carrier lifetime and recharged trap recovery rate. Large carrier lifetime and small diffusivity at low injections in highly compensated samples and their dependences on injection were explained by optical recharge of compensating aluminum impurities. The complete recharge of the compensating impurities by optical means allowed us to calculate the compensating aluminum density in n-type samples and compensating nitrogen in p-type ones.

Optical characterization of tensile-strained a p-type Ge layer on a Si (100) substrate

2013 ◽  
Vol 63 (5) ◽  
pp. 1034-1039 ◽  
Author(s):  
Yeon-Ho Kil ◽  
Hyeon Deok Yang ◽  
Jong-Han Yang ◽  
Joung Hee Kim ◽  
Joo Young Jung ◽  
...  
Keyword(s):  
Optical Characterization ◽  
P Type

Optical Characterization of p-Type 4H-SiC Epilayers

2015 ◽  
Vol 821-823 ◽  
pp. 249-252 ◽  
Author(s):  
Gediminas Liaugaudas ◽  
Donatas Dargis ◽  
Pawel Kwasnicki ◽  
Hervé Peyre ◽  
Roxana Arvinte ◽  
...  
Keyword(s):  
Carrier Lifetime ◽  
Diffusion Length ◽  
Hole Mobility ◽  
Optical Characterization ◽  
Optical Pump ◽  
Time Resolved ◽  
Pump Probe ◽  
Activation Ratio ◽  
P Type

A series of aluminium doped (from 2×1016to 8×1019cm-3) 4H-SiC epitaxial layers were mainly studied by Low Temperature Photoluminescence and time-resolved optical pump-probe techniques to determine the concentration of aluminium, its activation ratio, the doping related carrier lifetime, hole mobility and excess carrier diffusion length.

Electrical and optical characterization of extended defects induced in p-type Si after Si ion implantation

2013 ◽  
Vol 11 (1) ◽  
pp. 146-149 ◽  
Author(s):  
Cloud Nyamhere ◽  
Fuccio Cristiano ◽  
Francios Olivie ◽  
Elena Bedel-Pereira ◽  
Zahi Essa
Keyword(s):  
Ion Implantation ◽  
Optical Characterization ◽  
Extended Defects ◽  
P Type ◽  
Si Ion Implantation

Structural and optical characterization of p-type highly Fe-doped SnO2 thin films and tunneling transport on SnO2:Fe/p-Si heterojunction

2018 ◽  
Vol 434 ◽  
pp. 879-890 ◽  
Author(s):  
Walid Ben Haj Othmen ◽  
Zied Ben Hamed ◽  
Brigitte Sieber ◽  
Ahmed Addad ◽  
Habib Elhouichet ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Characterization ◽  
Sno2 Thin Films ◽  
P Type ◽  
Tunneling Transport
Sign in / Sign up

Export Citation Format

Share Document